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2017 ROCS Digest

2017 ROCS Digest

$75.00

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JEP122H Failure Mechanisms and Models for Semiconductor Devices

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$163.00

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JESD209-3C LPDDR3

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$208.00

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JESD22-A104E Temperature Cycling

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$59.00

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JESD22-A108F Temperature, Bias and Operating Life

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$54.00

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JESD22-A110E Highly Accelerated Temperature and Humidity Stress Test (HAST)

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$54.00

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JESD22-A113H Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing

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JESD47K Stress-Test-Driven Qualification of Integrated Circuits

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$74.00

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JESD79-3F DDR3

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$247.00

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