JEP122H Failure Mechanisms and Models for Semiconductor Devices
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$163.00
JESD22-A108F Temperature, Bias and Operating Life
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$54.00
JESD22-A110E Highly Accelerated Temperature and Humidity Stress Test (HAST)
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$54.00
JESD22-A113H Preconditioning of Nonhermetic Surface Mount Devices Prior to Reliability Testing
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$59.00
JESD47K Stress-Test-Driven Qualification of Integrated Circuits
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